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Experimental Equipment

Electron Black Scatter Diffractor Detector

Our SEM (scanning electron microscope) is also equipped with an EBSD detector (electron back scatter diffraction detector). This additional accessory to our Tescan FERA3 SEM widens our capabilities for microstructure characterization. Using EBSD and paired with TSL OIM software we can perform texture analysis across a vast array of materials. The EDAX Hikari EBSD pro can index ~600 points per second and can operate at beam currents as low as 100 pA and accelerating voltages as low as 5kV. This low range allows for high detector sensitivity. The EDAX can also perform precision orientation measurements to less than 1°.

Hikari EBSD: http://www.edax.com/Products/EBSD/Hikari-EBSD- Cameras.aspx

FERA3: http://www.tescan.com/en/products/fera

Nano Indenter G200

The Nano Indenter G200 enables users to measure Young’s modulus and hardness in compliance with ISO 14577. Electromagnetic actuation allows large dynamic range in force and displacement and measurement of deformation over six orders of magnitude (from nanometers to millimeters). The Continuous Stiffness Measurement (CSM) option satisfies application requirements that must take into account dynamic effects, such as strain rate and frequency. It allows control of indentation tests with a constant strain rate. CSM is a powerful tool not only for stiff materials such as metals, alloys, and ceramics but also for time-dependent materials like polymers, structural composites, and biomedical materials providing dynamic properties by indentation depth. More applications include semiconductor, thin films, and MEMs (wafer applications); hard coatings and DLC films; composite materials, fibers, and polymers; metals and ceramics; and biomaterials and biology.

Nano Indenter G200: http://www.keysight.com/en/pd-1675520-pn-U9820A/agilent-nano-indenter-g200?nid=-34000.901863&cc=US&lc=eng&pselect=SR.Looking

Plasma Cleaner PDC-32G

Our plasma cleaner is a compact, inexpensive tabletop plasma instrument with a hinged door and viewing window, active fan cooling and improved metering valve, suitable for nanoscale surface cleaning and activation of small samples.
Specifications: 3” Dia. x 6.5” L Chamber; 18 W Maximum RF Power; 13 Lbs., 9” H x 10” W x 8” D

Plasma Cleaner PDC-32G: https://s3.amazonaws.com/cdn.sitemandala.com/media/100110/original/Harrick%20Plasma%20Basic%20Plasma%20Cleaner%20datasheet.pdf

Epoxy System: https://shop.buehler.com/mounting/castable-mounting- systems/epoxicure-2- epoxy-system

Vibro Polisher

From Brochure: The VibroMet® 2 Vibratory Polisher removes minor deformation remaining after mechanical preparation revealing a stress-free surface without need for the hazardous electrolytes required by electro-polishers. Combine the VibroMet 2 with MasterMet 2 collidal silica to chemomechanically polish a specimen to a surface finish suitable for electron-backscatter diffraction (EBSD) or atomic force microscopy (AFM). Unlike traditional vibratory polishers, the VibroMet 2 oscillates almost entirely horizontally, maximizing the length of time the specimen touches the polishing cloth. Specimens naturally rotate around the polishing bowl for an even polish. Training required.

More information can be found at http://www.buehler.com/VibroMet-2.php

Mechanical Polisher

Struers Tegramin 30
This machine is used for grinding and polishing of mounted samples to remove surface defects and create a stress-free surface. Automatic dosing and applied force provide consistent results. It is compatible with 300 mm grinding papers and polishing pads. Attachments accommodate 6 1-inch samples or 4 2-inch samples. Training required.

More information can be found at http://www.struers.com/default.asp?top_id=3&main_id=10&sub_id=300&doc_id=1197

Ion Polisher

Hitachi IM 4000 Ion Milling system
This is a system for cross section and flat surface ion milling of materials. It provides a stress-free physical process for removing small amounts of material from the surface of a specimen. Training required.

More information can be found at http://www.hitachi- hightech.com/eu/product_detail/?pn=em-im4000

Data acquisition (DAQ) Omega System

Data acquisition (DAQ) Omega system (OM-DAQ- USB-2401) is small portable measuring device that works for 8 differential or 16 single-ended analog inputs. The main use of the device is in heat treatment process to record temperature variation during the process in a single or multiple samples. It records data as fast as 1000 point /sec and works for Type J, K, T, E, R, S, B, N thermocouple with an accuracy of ±1.0°C.

Data acquisition (DAQ) Omega system http://www.omega.com/pptst/OM-DAQ-USB-2400.html

Fisher Scientific FS20 Ultrasonic Cleaner

The Fisher Scientific FS20 Ultrasonic Cleaner uses a 40 kHz industrial transducer to remove contamination, polishing material residue, or dust from the surface of a polished sample, and improves imaging in microscopy. The Fisher Scientific FS20 Ultrasonic Cleaner has a tank with dimensions of inch 3 or 3.0 QT.

Fisher Scientific FS20 Ultrasonic Cleaner https://www.fishersci.com/us/en/products/I9C8JVSX/ultrasonic-cleaners.html

Allied Techcut 5 high speed saw

The TechCut 5™ precision high speed saw is a versatile, programmable machine designed to cut a wide variety and size of materials. It automatically sections materials at high speeds, increasing sample throughput. The microprocessor-based system controls sample feed rate, distance and force, and automatically adjusts feed rate as the cutting condition changes due to varying thickness and/or material differences in the sample. When sectioning is complete, the table automatically retracts the sample to the home position and stops blade rotation and coolant. The unique fixturing system allows for easy changes between the T-Slot Table and the X-Axis Tables. Both tables offer a variety of convenient table-specific fixture options.

Brochure: http://www.alliedhightech.com/Media/Default/images/TechCut%205%20Brochure%202016.pdf